Two-step growth of VSe
2
films and their photoelectric properties
Zeng Yu
1
, Zhang Shengli
1
, Li Xiuling
1
, Ao Jianping
1
, Sun Yun
1
, Liu Wei
1
, Liu Fangfang
1
, Gao Peng
2
, Zhang Yi
1, †
XRD pattern of the sample with 50 nm thick V film selenized at 550 °C.