Two-step growth of VSe2 films and their photoelectric properties
Zeng Yu1, Zhang Shengli1, Li Xiuling1, Ao Jianping1, Sun Yun1, Liu Wei1, Liu Fangfang1, Gao Peng2, Zhang Yi1, †
       

XRD pattern of the sample with 50 nm thick V film selenized at 550 °C.