Photodetectors based on small-molecule organic semiconductor crystals Project supported by the National Natural Science Foundation of China (Grant Nos. 51672180, 51622306, and 21673151), Collaborative Innovation Center of Suzhou Nano Science & Technology, the Priority Academic Program Development of Jiangsu Higher Education Institutions (PAPD), the 111 Project, Joint International Research Laboratory of Carbon-Based Functional Materials and Devices. |
(a) Schematic illustration of transferring 2D TFT-CN films onto an arbitrary substrate. (b) Optical microscopy image of a TFT-CN film, the inset is the corresponding SAED pattern. (c) Atomic force microscopy (AFM) image of a TFT-CN film with an average roughness of ∼ 0.36 nm and thickness of ∼ 4.8 nm. (d) Schematic diagram of OPTs with different active layer thicknesses under different VG in dark. (a)–(d) Reproduced with permission.[ |