Mechanism of Ti/Al/Ni/Au ohmic contacts to AlGaN/GaN heterostructures via laser annealing<xref rid="cpb_28_3_037302fn1" ref-type="fn">*</xref><fn id="cpb_28_3_037302fn1"><label>*</label><p>Projects supported by the National Natural Science Foundation of China (Grant Nos. 51577169 and 51777187) and the National Key Research and Development Program of China (Grant No. 2017YFB0402804).</p></fn>

Mechanism of Ti/Al/Ni/Au ohmic contacts to AlGaN/GaN heterostructures via laser annealing**

Projects supported by the National Natural Science Foundation of China (Grant Nos. 51577169 and 51777187) and the National Key Research and Development Program of China (Grant No. 2017YFB0402804).

Hou Mingchen, Xie Gang^†, Sheng Kuang

The cross-sectional TEM micrographs of ohmic contacts to AlGaN/GaN heterostructures annealed by (a) RTA and (b) LA. Higher magnification is acquired in the proximity of the interface for (c) RTA sample and (d) LA sample.