A review on MBE-grown HgCdSe infrared materials on GaSb (211)B substrates
Zhang Z K, Pan W W, Liu J L, Lei W
       

RSM data for ZnTe buffer layers grown on GaSb substrates with a thickness of (a) 150 nm, (b) 300 nm, (c) 400 nm, (d) 600 nm, and (e) 1000 nm.