Influence of characteristics’ measurement sequence on total ionizing dose effect in PDSOI nMOSFET

Xie Xin^{1, 2, †}, Bi Da-Wei¹, Hu Zhi-Yuan¹, Zhu Hui-Long^{1, 2}, Zhang Meng-Ying^{1, 2}, Zhang Zheng-Xuan¹, Zou Shi-Chang¹

(color online) Energy band diagrams of PDSOI nMOSFETs, respectively, (a) at the bottom corner of STI and (b) in the BOX. TAT is trap-assisted tunneling. CAT is positive charge-assisted tunneling. Yellow region is electron trap. Blue circles are positive charge centers.