Influence of characteristics’ measurement sequence on total ionizing dose effect in PDSOI nMOSFET

Xie Xin^{1, 2, †}, Bi Da-Wei¹, Hu Zhi-Yuan¹, Zhu Hui-Long^{1, 2}, Zhang Meng-Ying^{1, 2}, Zhang Zheng-Xuan¹, Zou Shi-Chang¹

Plot of difference in drain leakage current (ΔI_off) between the samples from group-front and samples from group-back under ON bias and PG bias, which are all values from the first test.