(color online) Material descriptor for the high-throughput screening of topological insulators.^[9] The extraction of the TI robustness descriptor from band energy versus strain variations in SOC and noSOC calculations is shown. are are the band gaps (at k point) from SOC and noSOC calculations, and ΔE_k is defined as the energy difference between are . (a) Bi₂Te₂S at k = Γ, and (b) PbTe at k = N of the body-centered tetragonal Brillouin zone.^[27] The vertical green line shows the relaxed lattice constant from DFT calculations, a₀, whereas the vertical blue line indicates the critical value, a_crit, for the TI to non-TI transition. Adapted from Ref. [9]