High-throughput research on superconductivity<xref rid="cpb_27_12_127402_fn1" ref-type="fn">*</xref><fn id="cpb_27_12_127402_fn1"><label>*</label><p>Project supported by the National Key Basic Research Program of China (Grant Nos. 2015CB921000, 2016YFA0300301, 2017YFA0303003, and 2017YFA0302902), the National Natural Science Foundation of China (Grant Nos. 11674374, 11804378, and 11574372), the Beijing Municipal Science and Technology Project (Grant No. Z161100002116011), the Key Research Program of Frontier Sciences, Chinese Academy of Sciences (Grant Nos. QYZDBSSW-SLH008 and QYZDY-SSW-SLH001), the Strategic Priority Research Program of the Chinese Academy of Sciences (Grant No. XDB07020100), and the Opening Project of Wuhan National High Magnetic Field Center (Grant No. PHMFF2015008).</p></fn>

High-throughput research on superconductivity**

Project supported by the National Key Basic Research Program of China (Grant Nos. 2015CB921000, 2016YFA0300301, 2017YFA0303003, and 2017YFA0302902), the National Natural Science Foundation of China (Grant Nos. 11674374, 11804378, and 11574372), the Beijing Municipal Science and Technology Project (Grant No. Z161100002116011), the Key Research Program of Frontier Sciences, Chinese Academy of Sciences (Grant Nos. QYZDBSSW-SLH008 and QYZDY-SSW-SLH001), the Strategic Priority Research Program of the Chinese Academy of Sciences (Grant No. XDB07020100), and the Opening Project of Wuhan National High Magnetic Field Center (Grant No. PHMFF2015008).

Qin Mingyang¹, Lin Zefeng¹, Wei Zhongxu¹, Zhu Beiyi¹, Yuan Jie^{1, 2}, Takeuchi Ichiro^{3, †}, Jin Kui^{1, 2, ‡}

(color online) Typical high-throughput characterization techniques. (a) Schematic diagram of the x-ray characterization system for combinatorial material studies.^[44] (b) Experimental setup of the scanning near-field ellipsometric microscope.^[59] (c) The 196-pin device for four-contact resistivity measurements.^[49] (d) Schematic diagram of the probe to measure thermal transport signals.^[51] (e) Schematics of the probe used in the scanning evanescent microwave microscope.^[12]