Coupling-induced spectral splitting for plasmonic sensing with ultra-high figure of merit<xref rid="cpb_27_11_117302fn1" ref-type="fn">*</xref> <fn id="cpb_27_11_117302fn1"> <label>*</label> <p>Project supported by the National Key R&D Program of China (Grant No. 2017YFA0303800), the National Natural Science Foundation of China (Grant Nos. 61705186, 11634010, and 11774290), the Natural Science Basic Research Plan in Shaanxi Province, China (Grant No. 2017JQ1023), the Technology Foundation for Selected Overseas Chinese Scholar of Shaanxi Province, China (Grant No. 2017007), and the Fundamental Research Funds for the Central Universities, China (Grant Nos. 3102018zy039 and 3102018zy050).</p> </fn>

Coupling-induced spectral splitting for plasmonic sensing with ultra-high figure of merit* *

Project supported by the National Key R&D Program of China (Grant No. 2017YFA0303800), the National Natural Science Foundation of China (Grant Nos. 61705186, 11634010, and 11774290), the Natural Science Basic Research Plan in Shaanxi Province, China (Grant No. 2017JQ1023), the Technology Foundation for Selected Overseas Chinese Scholar of Shaanxi Province, China (Grant No. 2017007), and the Fundamental Research Funds for the Central Universities, China (Grant Nos. 3102018zy039 and 3102018zy050).

Lu Hua^†, Fan Yi-Cun, Dai Si-Qing, Mao Dong, Xiao Fa-Jun, Li Peng, Zhao Jian-Lin

(color online) Schematic diagram of the multilayer configuration with an incident angle θ of light. Here, n₀: refractive index of dielectric prism substrate, d₁ (n₁: thickness (refractive index) of gold film, d₂ (n₂): thickness (refractive index) of the first SiO₂ layer, d₃ ( n₃): thickness (refractive index) of the first Al₂O₃ layer, d₄ (n₄): thickness (refractive index) of the second SiO₂ layer, d₅ (n₅): thickness (refractive index) of the second Al₂O₃ layer, and n₆: refractive index of the environment.