Twin boundary dominated electric field distribution in CdZnTe detectors<xref rid="cpb_27_11_117202fn1" ref-type="fn">*</xref><fn id="cpb_27_11_117202fn1"><label>*</label><p>Project supported by the National Natural Science Foundation of China (Grant Nos. U1631116 and 51702271), the National Key Research and Development Program of China (Grant No. 2016YFE0115200), the Natural Science Basic Research Plan in Shaanxi Province of China (Grant No. 2017KW-029), Austrian Academic Exchange Service (ÖD-WTZ) through project CN 02/2016, the Fundamental Research Funds for the Central Universities of China (Grant Nos. 3102017zy057 and 3102018jcc036), and the Young and Middle-aged Teachers Education and Scientific Research Foundation of Fujian Province, China (Grant No. JAT170407).</p></fn>

Twin boundary dominated electric field distribution in CdZnTe detectors**

Project supported by the National Natural Science Foundation of China (Grant Nos. U1631116 and 51702271), the National Key Research and Development Program of China (Grant No. 2016YFE0115200), the Natural Science Basic Research Plan in Shaanxi Province of China (Grant No. 2017KW-029), Austrian Academic Exchange Service (ÖD-WTZ) through project CN 02/2016, the Fundamental Research Funds for the Central Universities of China (Grant Nos. 3102017zy057 and 3102018jcc036), and the Young and Middle-aged Teachers Education and Scientific Research Foundation of Fujian Province, China (Grant No. JAT170407).

Dong Jiangpeng^{1, 2}, Jie Wanqi^{1, 2}, Yu Jingyi², Guo Rongrong³, Teichert Christian⁴, Gradwohl Kevin-P⁴, Zhang Bin-Bin², Luo Xiangxiang², Xi Shouzhi², Xu Yadong^{1, 2, †}

(color online) Electric field distribution in CdZnTe device. (a) The contour map of electric field distribution profile extracted from the PE images at various applied bias. (b) The electric field distribution profiles at −1800 V and 1800 V. Inset is the PE images (5 × 5 mm²), correspondingly.