Synergistic effect of total ionizing dose on single event effect induced by pulsed laser microbeam on SiGe heterojunction bipolar transistor

Zhang Jin-Xin¹, Guo Hong-Xia^{2, 3}, Pan Xiao-Yu³, Guo Qi², Zhang Feng-Qi³, Feng Juan^{1, †}, Wang Xin², Wei Yin², Wu Xian-Xiang¹

(color online) Plots of charge collection of base versus energy of collector after being experienced by TID irradiation at all-grounded bias with different dose rates.