Total ionizing dose effects in pinned photodiode complementary metal-oxide-semiconductor transistor active pixel sensor
Ma Lin-Dong1, 2, 3, Li Yu-Dong1, 2, Wen Lin1, 2, Feng Jie1, 2, Zhang Xiang1, 2, 3, Wang Tian-Hui1, 2, 3, Cai Yu-Long1, 2, 3, Wang Zhi-Ming1, 2, 3, Guo Qi1, 2, †
       

FWC decaying with TID increasing.