Total ionizing dose effects in pinned photodiode complementary metal-oxide-semiconductor transistor active pixel sensor

Ma Lin-Dong^{1, 2, 3}, Li Yu-Dong^{1, 2}, Wen Lin^{1, 2}, Feng Jie^{1, 2}, Zhang Xiang^{1, 2, 3}, Wang Tian-Hui^{1, 2, 3}, Cai Yu-Long^{1, 2, 3}, Wang Zhi-Ming^{1, 2, 3}, Guo Qi^{1, 2, †}

Variations of dark current with annealing time at different temperatures.