Thickness dependent manipulation of uniaxial magnetic anisotropy in Fe-thin films by oblique deposition

Gul Qeemat^{1, 2}, He Wei^{1, 2}, Li Yan^{1, 2}, Sun Rui^{1, 2}, Li Na^{1, 2}, Yang Xu^{1, 2}, Li Yang^{1, 2}, Gong Zi-Zhao^{1, 2}, Xie ZongKai^{1, 2}, Zhang Xiang-Qun¹, Cheng Zhao-Hua^{1, 2, †}

X-ray reflectivity measurement of Fe-film thickness (t_Fe) and roughness (σ) as a function of deposition angle α.