Nondestructive determination of film thickness with laser-induced surface acoustic waves
The SAWs signals detected at different distances (a) x1 and (b) x2 away from the line-shaped laser source on SiO2 I.
Nondestructive determination of film thickness with laser-induced surface acoustic waves |
The SAWs signals detected at different distances (a) x1 and (b) x2 away from the line-shaped laser source on SiO2 I. |
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