Effect of microstructure on <sup>3</sup>He migration in TiT<sub>1.9</sub> films

Effect of microstructure on ³He migration in TiT_1.9 films

Wang Haifeng, Peng Shuming^†, Ding Wei, Shen Huahai, Wang Weidu, Zhou Xiaosong, Long Xinggui

Bright-field images of samples at He:Ti ratios of 0.109. (a) Underfocus; (b) the corresponding diffraction pattern of the selected-area (close to [110] zone axis).