Effect of microstructure on <sup>3</sup>He migration in TiT<sub>1.9</sub> films

Effect of microstructure on ³He migration in TiT_1.9 films

Wang Haifeng, Peng Shuming^†, Ding Wei, Shen Huahai, Wang Weidu, Zhou Xiaosong, Long Xinggui

(a) A big crack along the strip feature at the grain boundaries of sample C. (b) The strip feature distributed in the grain of sample E.