Effect of microstructure on <sup>3</sup>He migration in TiT<sub>1.9</sub> films

Effect of microstructure on ³He migration in TiT_1.9 films

Wang Haifeng, Peng Shuming^†, Ding Wei, Shen Huahai, Wang Weidu, Zhou Xiaosong, Long Xinggui

Helium bubble distribution inside grains of the two kinds of films. (a) Sample C at He:Ti ratio of 0.299. (b) Sample E at He:Ti ratio of 0.356.