Effect of microstructure on <sup>3</sup>He migration in TiT<sub>1.9</sub> films

Effect of microstructure on ³He migration in TiT_1.9 films

Wang Haifeng, Peng Shuming^†, Ding Wei, Shen Huahai, Wang Weidu, Zhou Xiaosong, Long Xinggui

Grain structure and ³He-filled cracks in the two kinds of films at the beginning of accelerated release. (a) Columnar grain structure of sample C at He:Ti ratio of 0.299. (b)–(c) Equiaxed grain structure of sample E at He:Ti ratio of 0.356. The circled areas in (b) and (c) show the hidden right part of the crack which is growing along one of the {111} planes of the grain below as indicated by the corresponding selected-area diffraction pattern (close to [110] zone axis).