Effect of microstructure on 3He migration in TiT1.9 films
Wang Haifeng, Peng Shuming †, Ding Wei, Shen Huahai, Wang Weidu, Zhou Xiaosong, Long Xinggui
       

(color online) Diffraction peaks of the two kinds of films. He:Ti ratios of sample C and E are 0.299 and 0.356, respectively.