Electronic states and molecular orientation of ITIC film*

Project supported by the National Natural Science Foundation of China (Grant Nos. 11374258 and 11079028).

Du Ying-Ying1, Lin De-Qu1, Chen Guang-Hua1, Bai Xin-Yuan1, Wang Long-Xi1, Wu Rui2, Wang Jia-Ou2, Qian Hai-Jie2, Li Hong-Nian1, †
       

Angle-dependent C K-edge XAS spectra of ITIC film on (a) Al, (b) ITO, and (c) Si substrate, where the spectra are normalized to the intensity at = 295 eV in each panel. In panel (c), the spectrum of the Ca-doped ITIC/Si (indicated by an arrow) is also shown for comparison. The inset in panel (a) shows the C 1s XPS spectrum of the ITIC/Al and the C 1s DOS calculated for the ITIC molecule; the energy of DOS has been shifted to coincide with the binding energy of the XPS spectrum. Inset in panel (b) displays the definition of θ.