Electronic states and molecular orientation of ITIC film Project supported by the National Natural Science Foundation of China (Grant Nos. 11374258 and 11079028). |
Angle-dependent C K-edge XAS spectra of ITIC film on (a) Al, (b) ITO, and (c) Si substrate, where the spectra are normalized to the intensity at hυ = 295 eV in each panel. In panel (c), the spectrum of the Ca-doped ITIC/Si (indicated by an arrow) is also shown for comparison. The inset in panel (a) shows the C 1s XPS spectrum of the ITIC/Al and the C 1s DOS calculated for the ITIC molecule; the energy of DOS has been shifted to coincide with the binding energy of the XPS spectrum. Inset in panel (b) displays the definition of θ. |