Time-dependent crosstalk effects for image sensors with different isolation structures<xref rid="cpb_27_8_088503fn1" ref-type="fn">*</xref><fn id="cpb_27_8_088503fn1"><label>*</label><p>Project supported by the National Key Research and Development Program of China (Grant No. NKRDP 2016YFA0202101).</p></fn>

Time-dependent crosstalk effects for image sensors with different isolation structures**

Project supported by the National Key Research and Development Program of China (Grant No. NKRDP 2016YFA0202101).

Shen Lei, Liu Li-Qiao, Hao Hao, Du Gang, Liu Xiao-Yan^†

(color online) Accumulated electron density profiles with DTI thickness values of 0.5 μm and 3 μm at three exposure times.