Time-dependent crosstalk effects for image sensors with different isolation structures*

Project supported by the National Key Research and Development Program of China (Grant No. NKRDP 2016YFA0202101).

Shen Lei, Liu Li-Qiao, Hao Hao, Du Gang, Liu Xiao-Yan
       

(color online) Accumulated electron density profiles for 400-nm, 500-nm, and 750-nm incident light at three exposure times.