Effect of flash thermal annealing by pulsed current on rotational anisotropy in exchange-biased NiFe/FeMn film<xref rid="cpb_27_8_087504fn1" ref-type="fn">*</xref><fn id="cpb_27_8_087504fn1"><label>*</label><p>Project supported by the Young Science and Technology Innovation Team of Sichuan Province, China (Grant No. 2017TD0020).</p></fn>

Effect of flash thermal annealing by pulsed current on rotational anisotropy in exchange-biased NiFe/FeMn film**

Project supported by the Young Science and Technology Innovation Team of Sichuan Province, China (Grant No. 2017TD0020).

Wang Zhen^{1, †}, Tan Shi-Jie^{1, 2}, Li Jun¹, Dai Bo¹, Zou Yan-Ke²

(color online) (a) Variations of exchange bias field (H_e) and static anisotropy field () with capacitor voltage. (b) Comparison among dynamic magnetic anisotropy (), and rotatable anisotropy (H_rot) as a function of capacitor voltage.