Effect of Au/Ni/4H–SiC Schottky junction thermal stability on performance of alpha particle detection<xref rid="cpb_27_8_087304fn1" ref-type="fn">*</xref><fn id="cpb_27_8_087304fn1"><label>*</label><p>Project supported by the National Natural Science Foundation of China (Grant Nos. 11675198, 61574026, and 11405017), the National Key Research and Development Program of China (Grant Nos. 2016YFB0400600 and 2016YFB0400601), the Natural Science Foundation of Liaoning Province of China (Grant Nos. 201602453 and 201602176), and the China Postdoctoral Science Foundation (Grant No. 2016M591434).</p></fn>

Effect of Au/Ni/4H–SiC Schottky junction thermal stability on performance of alpha particle detection**

Project supported by the National Natural Science Foundation of China (Grant Nos. 11675198, 61574026, and 11405017), the National Key Research and Development Program of China (Grant Nos. 2016YFB0400600 and 2016YFB0400601), the Natural Science Foundation of Liaoning Province of China (Grant Nos. 201602453 and 201602176), and the China Postdoctoral Science Foundation (Grant No. 2016M591434).

Ye Xin², Xia Xiao-Chuan¹, Liang Hong-Wei^{1, †}, Li Zhuo², Zhang He-Qiu¹, Du Guo-Tong², Cui Xing-Zhu³, Liang Xiao-Hua^{3, 4}

(color online) X-ray diffraction spectra of the Au/Ni/n-type 4H–SiC Schottky detectors after deposition and after being annealed between 400 °C and 700 °C.