The properties of surface nanobubbles formed on different substrates<xref rid="cpb_27_8_086803fn1" ref-type="fn">*</xref><fn id="cpb_27_8_086803fn1"><label>*</label><p>Project supported by the National Natural Science Foundation of China (Grant Nos. 11290165, 11305252, and U1532260), the Knowledge Innovation Program of the Chinese Academy of Sciences, China (Grant No. KJZD-EW-M03), and the Key Research Program of Frontier Sciences, Chinese Academy of Sciences, China (Grant No. QYZDJ-SSW-SLH019).</p></fn>

The properties of surface nanobubbles formed on different substrates**

Project supported by the National Natural Science Foundation of China (Grant Nos. 11290165, 11305252, and U1532260), the Knowledge Innovation Program of the Chinese Academy of Sciences, China (Grant No. KJZD-EW-M03), and the Key Research Program of Frontier Sciences, Chinese Academy of Sciences, China (Grant No. QYZDJ-SSW-SLH019).

Zou Zheng-Lei^{1, 3}, Quan Nan-Nan^{1, 3}, Wang Xing-Ya^{3, 4}, Wang Shuo^{2, 4}, Zhou Li-Min^{2, 4}, Hu Jun², Zhang Li-Juan^{3, †}, Dong Ya-Ming^{1, ‡}

(color online) TM-AFM images of (a) HOPG, (b) DTS modified silicon, and (c) OTS modified silicon in air. The root-mean-square (RMS) roughnesses of the surface of panels (a), (b), and (c) are 0.7 nm, 0.37 nm, and 0.45 nm, respectively. Scan size is 5 μm ×5 μm, and the data scale is 10 nm.