Dependence of single event upsets sensitivity of low energy proton on test factors in 65 nm SRAM*

Project supported by the Major Program of the National Natural Science Foundation of China (Grant Nos. 11690040 and 11690043).

Luo Yin-Yong, Zhang Feng-Qi, Pan Xiao-Yu, Guo Hong-Xia, Wang Yuan-Ming
       

(color online) Energy distributions of 1.2 MeV normal incidence beam after passing through the 12 μm Al foil and metallization layers.