Dependence of single event upsets sensitivity of low energy proton on test factors in 65 nm SRAM*

Project supported by the Major Program of the National Natural Science Foundation of China (Grant Nos. 11690040 and 11690043).

Luo Yin-Yong, Zhang Feng-Qi, Pan Xiao-Yu, Guo Hong-Xia, Wang Yuan-Ming
       

(color online) Proton LET in silicon as a function of proton energy.