Dependence of single event upsets sensitivity of low energy proton on test factors in 65 nm SRAM<xref rid="cpb_27_7_078501_fn1" ref-type="fn">*</xref> <fn id="cpb_27_7_078501_fn1"> <label>*</label> <p>Project supported by the Major Program of the National Natural Science Foundation of China (Grant Nos. 11690040 and 11690043).</p> </fn>

Dependence of single event upsets sensitivity of low energy proton on test factors in 65 nm SRAM* *

Project supported by the Major Program of the National Natural Science Foundation of China (Grant Nos. 11690040 and 11690043).

Luo Yin-Yong^†, Zhang Feng-Qi, Pan Xiao-Yu, Guo Hong-Xia, Wang Yuan-Ming

(color online) Low energy proton SEU peak cross section versus supply voltage with three test patterns in 65 nm SRAM.