Growth and transport properties of topological insulator Bi2Se3 thin film on a ferromagnetic insulating substrate*
Project supported by the National Key R&D Program of China (Grant Nos. 2016YFA0300904 and 2016YFA0202301), the National Natural Science Foundation of China (Grant Nos. 11334011, 11674366, 11674368, and 11761141013), and the Strategic Priority Research Program of the Chinese Academy of Sciences (Grant Nos. XDB07010200 and XDPB06).
Magnetotransport properties of the Bi2Se3/LCO heretostructure devices. All the data are measured at 1.7 K. (a) Hall resistance (Rxy) of several Bi2Se3/LCO samples as a function of the perpendicular magnetic field. (b) Initial carrier density (black squares) and carrier mobility (red circles) derived from several Bi2Se3/LCO samples grown at different substrate temperatures (denoted by Tsub) ranging from 150 °C to 225 °C. (c) Magnetoresistance (MR) measured in perpendicular magnetic field of four Bi2Se3/LCO samples (in solid symbols) grown at Tsub = 150 °C, 175 °C, 200 °C, 225 °C, respectively, and a control sample (in pink open symbol) of Bi2Se3/STO grown at Tsub = 150 °C. (d) Magnetoconductivity in low-field range of the corresponding samples in (c) as well as two additional curves of the Bi2Se3/STO control sample with Tsub = 150 °C at gate voltage 30 V and −100 V, respectively. The HLN fitting results of each curve are plotted in solid (orange) lines. (e) The fitting parameters of HLN equation for each Bi2Se3/LCO sample shown in (d). (f) MR of a typical Bi2Se3/LCO sample grown at optimal Tsub = 150 °C measured in tilted field. The tilted angle is defined as the angle between the applied magnetic field and the film plane.