Ultrafast electron microscopy in material science<xref rid="cpb_27_7_070703fn1" ref-type="fn">*</xref><fn id="cpb_27_7_070703fn1"> <label>*</label><p>Project supported by the National Basic Research Program of China (Grant No. 2015CB921300), the National Key Research and Development Program of China (Grant Nos. 2016YFA0300300, 2017YFA0504703, and 2017YFA0302900), the National Natural Science Foundation of China (Grant Nos. 11604372, 11474323, and 11774391), the “Strategic Priority Research Program (B)” of the Chinese Academy of Sciences (Grant No. XDB07020000), and the Scientific Instrument Developing Project of the Chinese Academy of Sciences (Grant No. ZDKYYQ20170002). Z. A. L acknowledges the financial support of the Hundred Talent Program B from CAS.</p> </fn>

Ultrafast electron microscopy in material science* *

Project supported by the National Basic Research Program of China (Grant No. 2015CB921300), the National Key Research and Development Program of China (Grant Nos. 2016YFA0300300, 2017YFA0504703, and 2017YFA0302900), the National Natural Science Foundation of China (Grant Nos. 11604372, 11474323, and 11774391), the “Strategic Priority Research Program (B)” of the Chinese Academy of Sciences (Grant No. XDB07020000), and the Scientific Instrument Developing Project of the Chinese Academy of Sciences (Grant No. ZDKYYQ20170002). Z. A. L acknowledges the financial support of the Hundred Talent Program B from CAS.

Yang Huaixin^{1, 2}, Sun Shuaishuai¹, Zhang Ming^{1, 2}, Li Zhongwen^{1, 2}, Li Zian¹, Xu Peng¹, Tian Huanfang¹, Li Jianqi^{1, 2, 3, †}

(color online) (a) Time evolution of an electron image for a Cu grid excited by femtosecond pump laser pulses. (b) Normalized changes (measured according to the RMS) of the signal difference as a function of the time delay. Reprinted from Ref. [11] with permission.