Ultrafast electron microscopy in material science<xref rid="cpb_27_7_070703fn1" ref-type="fn">*</xref><fn id="cpb_27_7_070703fn1"> <label>*</label><p>Project supported by the National Basic Research Program of China (Grant No. 2015CB921300), the National Key Research and Development Program of China (Grant Nos. 2016YFA0300300, 2017YFA0504703, and 2017YFA0302900), the National Natural Science Foundation of China (Grant Nos. 11604372, 11474323, and 11774391), the “Strategic Priority Research Program (B)” of the Chinese Academy of Sciences (Grant No. XDB07020000), and the Scientific Instrument Developing Project of the Chinese Academy of Sciences (Grant No. ZDKYYQ20170002). Z. A. L acknowledges the financial support of the Hundred Talent Program B from CAS.</p> </fn>

Ultrafast electron microscopy in material science* *

Project supported by the National Basic Research Program of China (Grant No. 2015CB921300), the National Key Research and Development Program of China (Grant Nos. 2016YFA0300300, 2017YFA0504703, and 2017YFA0302900), the National Natural Science Foundation of China (Grant Nos. 11604372, 11474323, and 11774391), the “Strategic Priority Research Program (B)” of the Chinese Academy of Sciences (Grant No. XDB07020000), and the Scientific Instrument Developing Project of the Chinese Academy of Sciences (Grant No. ZDKYYQ20170002). Z. A. L acknowledges the financial support of the Hundred Talent Program B from CAS.

Yang Huaixin^{1, 2}, Sun Shuaishuai¹, Zhang Ming^{1, 2}, Li Zhongwen^{1, 2}, Li Zian¹, Xu Peng¹, Tian Huanfang¹, Li Jianqi^{1, 2, 3, †}

(color online) Schematic of the UTEM and the two typical experimental modes. (a) Simplified schematic of the UTEM experimental layout. (b) Electron dose in a single pulse for the stroboscopic mode (left) and the single-shot mode (right) (modified from Ref. [35], Fig. 1(a)). (c) Ultrafast electron microscope in our lab at the Institute of Physics. The UTEM is based on a JEOL EX2000 200-kV thermionic transmission electron microscope.