How to characterize capacitance of organic optoelectronic devices accurately<xref rid="cpb_27_6_067202_fn1" ref-type="fn">*</xref><fn id="cpb_27_6_067202_fn1"><label>*</label><p>Project supported by the Fundamental Research Funds for the Central Universities, China</p></fn>

How to characterize capacitance of organic optoelectronic devices accurately**

Project supported by the Fundamental Research Funds for the Central Universities, China

Yu Hao-Miao^{1, †}, He Yun^{2, ‡}

(color online) Curves of C–V characteristics of ITO/CuPc (310 nm)/Al and ITO/Alq₃ (200 nm)/Al, with the inset showing the relationship between the reciprocal of the square of the capacitance and the bias applied to the CuPc device.