How to characterize capacitance of organic optoelectronic devices accurately*

Project supported by the Fundamental Research Funds for the Central Universities, China

Yu Hao-Miao1, †, He Yun2, ‡
       

(color online) Plots of ZF characteristics of ITO/Alq3 (200 nm)/Al, Al/Alq3 (110 nm)/Al, ITO/CuPc (310 nm)/Al, and cables.