Scanning transmission electron microscopy: A review of high angle annular dark field and annular bright field imaging and applications in lithium-ion batteries<xref rid="cpb_27_6_066107_fn1" ref-type="fn">*</xref><fn id="cpb_27_6_066107_fn1"> <label>*</label> <p>Project supported by the National Basic Research Program of China (Grant No. 2014CB921002), the Strategic Priority Research Program of Chinese Academy of Sciences (Grant No. XDB07030200), and the National Natural Science Foundation of China (Grant Nos. 51522212, 51421002, and 51672307).</p> </fn>

Scanning transmission electron microscopy: A review of high angle annular dark field and annular bright field imaging and applications in lithium-ion batteries* *

Project supported by the National Basic Research Program of China (Grant No. 2014CB921002), the Strategic Priority Research Program of Chinese Academy of Sciences (Grant No. XDB07030200), and the National Natural Science Foundation of China (Grant Nos. 51522212, 51421002, and 51672307).

Tong Yu-Xin^{1, 2}, Zhang Qing-Hua^{1, †}, Gu Lin^{1, 2, ‡}

(color online) Simulated ABF defocus-thickness map for SrTiO₃ viewed along the [011] direction.^[12]