Quantitative HRTEM and its application in the study of oxide materials
Jia Chun-Lin1, 2, 3, †, Mi Shao-Bo3, Jin Lei1
       

(color online) Simulated images of STO viewed along the [110] direction under (a) the NCSI condition with , defocus Z = +6 nm, and (b) the PCSI condition with , defocus Z = −6 nm for a sample thickness of 3.3 nm. (SrO: yellow, Ti: orange, and O: cyan).[15]