Effects of growth conditions on optical quality and surface morphology of InGaAsBi

Li Jia-Kai^{1, 3}, Ai Li-Kun¹, Qi Ming¹, Xu An-Hui¹, Wang Shu-Min^{1, 2, †}

(color online) HRXRD (004) ω–2θ scans for InGaAsBi epilayers (b1–b5) on InP at different AsH₃ pressures.