Off-stoichiometry indexation of BiFeO3 thin film on silicon by Rutherford backscattering spectrometry
Wang Ze-Song1, †, Xiao Ren-Zheng2, Zou Chang-Wei1, Xie Wei1, Tian Can-Xin1, Xue Shu-Wen1, Liu Gui-Ang1, Devi Neena3, Fu De-Jun3
       

(color online) RBS spectra of the samples at room temperature and different temperatures ranging from 100 °C to 650 °C.