Pei Ke1, 2, 3, Xia Wei-Xing2, 3, †, Wang Bao-Min2, 3, Wen Xing-Cheng2, 3, Sheng Ping2, 3, Liu Jia-Ping2, 3, 4, Liu Xin-Cai1, ‡, Li Run-Wei2, 3
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(color online) In-situ LTEM results of sample C, showing (a) low-magnified bright field image and SADP (inset), ((b)–(h)) domain reversal process with magnetic field decreasing from 0 Oe to −300 Oe, which correspond to points b–h on the loop of sample C in Fig. 1, respectively, (i) distribution mapping of pinning force in the sample, and ((j) and (k)) SADPs of areas A and C in panel (i), respectively. Scale bars in panels (b)–(i) are all the same.
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