Sun Ling1, 2, Wang Lu1, Lu Jin-Lei1, 2, Liu Jie1, 2, Fang Jun1, 2, Xie Li-Li3, Hao Zhi-Biao3, Jia Hai-Qiang1, Wang Wen-Xin1, Chen Hong1, †
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(color online) (a) Atomic force microscopy (AFM) image of a
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m
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m
area with an RMS value of roughness of 1.59 Å, (b) three-dimensional AFM image of the grown material, and (c) x-ray diffraction pattern of InAsSb/GaSb QWs showing an antimony quantity of 8.4%, and (d) reciprocal space mapping (RSM) of InAsSb/GaSb QWs showing no lattice relaxation.
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