Chen Zhiyu1, Wang Ruifeng2, 3, Wang Guoyu2, 3, Zhou Xiaoyuan4, Wang Zhengshang1, Yin Cong1, Hu Qing1, Zhou Binqiang5, Tang Jun1, 6, ‡, Ang Ran1, 6, †
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(color online) (a) Powder XRD patterns for Sn1−xZnxTe (x = 0, 0.01, 0.02, 0.04) at room temperature. Inset: Crystal structure of SnTe. (b) Powder XRD pattern with Rietveld refinement for the sample with x=0.02. (c) Lattice parameter a as a function of Zn content x. The solid line represents Vegardʼs law. (d) SEM image for the sample with x=0.04. (e) Magnified SEM image within the white square area in panels (d). (f) The corresponding EDS results for spot 1 and spot 2 in image (e), respectively.
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