Analysis of multiple cell upset sensitivity in bulk CMOS SRAM after neutron irradiation
(color online) (a) Schematic diagram for testing P-well ESD diode’s breakdown voltage and (b) the experimental results.
Analysis of multiple cell upset sensitivity in bulk CMOS SRAM after neutron irradiation |
|
(color online) (a) Schematic diagram for testing P-well ESD diode’s breakdown voltage and (b) the experimental results. |
| |