Analysis of multiple cell upset sensitivity in bulk CMOS SRAM after neutron irradiation
(color online) (a) Schematic diagram for testing N-well ESD diode’s breakdown voltage and (b) the experimental results.
Analysis of multiple cell upset sensitivity in bulk CMOS SRAM after neutron irradiation |
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(color online) (a) Schematic diagram for testing N-well ESD diode’s breakdown voltage and (b) the experimental results. |
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