High mobility ultrathin ZnO p–n homojunction modulated by Zn0.85Mg0.15O quantum barriers
Yang Jing-Jing1, 2, Fang Qing-Qing1, †, Du Wen-Han2, 3, ‡, Zhang Ke-Ke3, Dong Da-Shun1
       

(color online) XRD pattern of ZnO/Zn0.85Mg0.15O ADB thin film on Si(100) substrate. Inset shows the XRD pattern at a different diffraction angle range of the same sample. The arrows marked with 1 and 1′ indicate the similarity of ZnMgO(002) and Si(400) XRD peak shapes.