Distinctive distribution of defects in CdZnTe:In ingots and their effects on the photoelectric properties
Fu Xu1, Wang Fang-Bao1, Zuo Xi-Ran1, Wang Ze-Jian1, Wang Qian-Ru1, Wang Ke-Qin1, Xu Ling-Yan1, Xu Ya-Dong1, Guo Rong-Rong1, 2, Yu Hui1, Jie Wan-Qi1, †
       

(color online) LBIC measurements by exposing from cathode side, showing current waveforms for samples (a) T04 and (c) W02, and fitting results of electron mobility in the samples (b) T04 and (d) W02. Inserts in panels (a) and (c) are enlarged parts of the dotted blue rectangles.