Distinctive distribution of defects in CdZnTe:In ingots and their effects on the photoelectric properties

Fu Xu¹, Wang Fang-Bao¹, Zuo Xi-Ran¹, Wang Ze-Jian¹, Wang Qian-Ru¹, Wang Ke-Qin¹, Xu Ling-Yan¹, Xu Ya-Dong¹, Guo Rong-Rong^{1, 2}, Yu Hui¹, Jie Wan-Qi^{1, †}

(color online) Images of CdZnTe: In crystal grown with the MVB method, showing (a) image of asgrown CZT ingot, and ((b), (c)) IRTM images of T04 and W02 samples cut from the head and tail regions of the ingot, respectively.