Vapor cell geometry effect on Rydberg atom-based microwave electric field measurement

Zhang Linjie^{1, 2, †}, Liu Jiasheng^{1, 2}, Jia Yue^{1, 2}, Zhang Hao^{1, 2}, Song Zhenfei³, Jia Suotang^{1, 2}

(color online) Distribution of microwave E-field strength for (a) y = 3, 0, −3 mm at the x axis in the cylinder cell; (b) y = 3, 0, −3 mm at the x axis in the cubic cell; (c) x = 3, 0, −3 mm at the y axis in the cylinder cell; (d) x = 3, 0, −3 mm at the y axis in the cubic cell. The red solid lines are the theoretical simulation taking account of the thickness of vapor cell.