Enhanced radiation-induced narrow channel effects in 0.13-<inline-formula> <img src="cpb_27_2_028501_ieqn1.gif"/> </inline-formula> PDSOI nMOSFETs with shallow trench isolation

Enhanced radiation-induced narrow channel effects in 0.13-

PDSOI nMOSFETs with shallow trench isolation

Zhang Meng-Ying^{1, 2, †}, Hu Zhi-Yuan¹, Bi Da-Wei¹, Dai Li-Hua^{1, 2}, Zhang Zheng-Xuan¹

(color online) Front gate – curves of T-gate NMOS in logarithmic scale for the different-width transistors measured at low and high drain voltages ( and 1.32 V) before and after ON bias irradiation, at (a) and (b). Solid line represents low drain bias, dashed line denotes high drain bias.