Observation of nonconservation characteristics of radio frequency noise mechanism of 40-nm n-MOSFET*

Project supported by the National Natural Science Foundation of China (Grant No. 69901003) and the Scientific Research Fund of Sichuan Provincial Education Department.

Wang Jun1, †, Peng Xiao-Mei1, Liu Zhi-Jun2, Wang Lin1, Luo Zhen1, Wang Dan-Dan1
       

(color online) Plots of measured Sid against IDS for 120-nm n-MOSFET at 10 GHz and VDS = 1.1 V.