Improved performance of Ge n+/p diode by combining laser annealing and epitaxial Si passivation
Wang Chen1, †, Xu Yihong2, Li Cheng3, Lin Haijun1
       

(color online) XPS spectra of germanium surface with silicon interlayer deposited at 390 °C with Si2H6 gas: (a) Si 2p, (b) Ge 3d.